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Electrical Modeling and Characterization of Shield Differential Through-Silicon Vias

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Institution:微电子学院

Title of Paper:Electrical Modeling and Characterization of Shield Differential Through-Silicon Vias

Journal:IEEE Transactions on Electron Devices

First Author:Qijun Lu, Zhangming Zhu*, Yintang Yang, Ruixue Ding

Indexed by:Journal paper

Document Code:000353564600027

Discipline:Engineering

First-Level Discipline:Electronics Science and Technology

Document Type:J

Volume:62

Issue:5

Page Number:1544-1552

Translation or Not:No

Date of Publication:2015-05-01

Included Journals:SCI

Date:2018-06-08

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