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Associate professor
Scientific Research
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- Wang, Shulong ; Liu, Hongxia ; Zhang, Hailin ,The influence of La/Al atomic ratio on the dielectric constant and band-gap of stack-gate La–Al–O/SiO<inf>2</inf>structure:Journal of Materials Science,2017,28(2):2004-2008
- Wang, Shulong^Liu, Hongxia^Chen, Qing^Zhang, Hailin,An analytical model of low field and high field electron mobility in wurtzite indium nitride:JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2016,27(11):1135-1135
- Wang, Shulong^Chen, Yuhai^Liu, Hongxia^Zhang, Hailin,The performance of Y2O3 as interface layer between La2O3 and p-type silicon substrate:AIP ADVANCES,2016,6(11)
- Wang, Shulong^Liu, Hongxia^Zhang, Hailin^Chen, Qing,Research on the origin of negative effect in uniform doping GaN-based Gunn diode under THz frequency:APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,2016,122(6)
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