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Study on the influence of 纬-ray total dose radiation effect on the threshold voltage and transconductance of the strained Si p-channel metal-oxid

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Institution:微电子学院

Title of Paper:Study on the influence of 纬-ray total dose radiation effect on the threshold voltage and transconductance of the strained Si p-channel metal-oxid

Journal:Wuli Xuebao/Acta Physica Sinica

First Author:Hu, Hui-Yong ; Liu, Xiang-Yu ; Lian, Yong-Chang ; Zhang, He-Ming ; Song, Jian-Jun ; Xuan, Rong-Xi ; Shu, Bin

Document Code:EI 20145100335911

Volume:63

Issue:23

Page Number:236102

Translation or Not:No

Date of Publication:2014-01-01

Included Journals:EI

Date:2018-06-08

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