Huiting Huan, Andreas Mandelis, Lixian Liu, Alexander Melnikov. “Local-Stress-Induced Thermal Conductivity Anisotropy Analysis Using Non-Destructive Photo-Thermo-Mechanical Lock-in Thermography (PTM-LIT) Imaging”. NDT&E International （1区TOP期刊）. 91, 79-87 2017
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Title of Paper:Huiting Huan, Andreas Mandelis, Lixian Liu, Alexander Melnikov. “Local-Stress-Induced Thermal Conductivity Anisotropy Analysis Using Non-Destructive Photo-Thermo-Mechanical Lock-in Thermography (PTM-LIT) Imaging”. NDT&E International （1区TOP期刊）. 91, 79-87 2017
Translation or Not:no
Pre One:Huiting Huan, Andreas Mandelis, Lixian Liu, Bahman Lashkari, Alexander Melnikov. “Application of linear frequency modulated laser ultrasonic radar in reflective thickness and defect non-destructive testing”. NDT&E International（1区TOP期刊）. 102, 84-89 2019
Next One:Huiting Huan, Andreas Mandelis, Lixian Liu, Alexander Melnikov. “Non-destructive and non-contacting stress–strain characterization of aerospace metallic alloys using photo-thermo-mechanical radiometry”. NDT&E International （1区TOP期刊）. 84, 47-53 2016