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Institution:计算机学院

Title of Paper:A Test Case Generation Approach Based on Sequence Diagram and Automata Models

Journal:CHINESE JOURNAL OF ELECTRONICS

First Author:Zhang Chen^Duan Zhenhua^Yu Bin^Tian Cong^Ding Ming

Document Code:SCI WOS:000372046100007

Volume:25

Issue:2

Page Number:234-240

ISSN:1022-4653

Translation or Not:No

Date of Publication:2016-01-01

Included Journals:SCI

Date:2018-06-08