New coaxial through silicon via (TSV) applied for three dimensional integrated circuits (3D ICs)
Release Time:2018-06-08 Hits:
- Institution:微电子学院
- Journal:IEICE ELECTRONICS EXPRESS
- First Author:Yang, Yintang^Zheng, Junping^Dong, Gang^Zhao, Yingbo^Mei, Zheng^Zhu, Weijun
- Document Code:SCI WOS:000377764100014
- Volume:13
- Issue:8
- ISSN:1349-2543
- Translation or Not:No
- Date of Publication:2016-01-01
- Included Journals:SCI