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Quantitative phase imaging based on fourier ptychographic microscopy: Advances, applications, and perspectives

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Title of Paper:Quantitative phase imaging based on fourier ptychographic microscopy: Advances, applications, and perspectives

Journal:Advanced Imaging

Discipline:Engineering

First-Level Discipline:Optical Engineering

Document Type:J

Volume:2

Issue:3

Page Number:032001

Translation or Not:No

Date of Publication:2025-07-27

Date:2026-03-18

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