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Application of length vernier in phase coincidence detection and precision frequency measurement

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Title of Paper:Application of length vernier in phase coincidence detection and precision frequency measurement

First Author:苗苗

Indexed by:Journal paper

Document Code:SCI, 000301566600044

Discipline:Engineering

Document Type:J

Volume:83

Issue:2

Translation or Not:no

Date of Publication:2012-02-01

Included Journals:SCI、SCI、SSCI

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