Current position: Home >> Scientific Research >> Patents

一种超高分辨率相位差测量的方法及系统

Hits:

Affilication of Author(s):机电工程学院

Patent Coverage:国内

First Author:Dong Shaofeng

Type of Patent:发明

Application Number:CN201310066563.6

Authorization number:CN201310066563.6

Number of Inventors:9

Service Invention or Not:no

Application Date:2013-03-02

Authorization Date:2015-03-18

Pre One:基于重合脉冲计数的异频信号相位重合检测系统

Next One:一种带温补的频率测量系统