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Title:电子材料与器件散粒噪声测试方法

Institution:历史退休人员库

Scope of Patent:国内

First Author:包军林

Type of Patent:Invent

Application Number:CN200810232533.7

Authorization Number:CN200810232533.7

Number of Inventors:5

Service Invention or Not:No

Application Date:2008-12-01

Authorization Date:2011-04-13

Date:2024-04-07